Browsing by Author "Ciprian, Dalibor"

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Browsing by Author "Ciprian, Dalibor"

Now showing items 21-40 of 41

Measurement of the group dispersion of the fundamental mode of holey fiber by white-light spectral interferometry

Hlubina, Petr; Szpulak, Marcin; Ciprian, Dalibor; Martynkien, Tadeusz; Urbańczyk, Wacław (Optics express. 2007, vol. 15, issue 18, p. 11073-11081.)
Modeling of magneto-optical properties of lamellar nanogratings

Foldyna, Martin; Postava, Kamil; Ciprian, Dalibor; Pištora, Jaromír (Journal of alloys and compounds. 2007, vols. 434-435, p. 581-583.)
Modeling of magneto-optical properties of periodic nanostructures

Foldyna, Martin; Postava, Kamil; Ciprian, Dalibor; Pištora, Jaromír (Journal of magnetism and magnetic materials. 2005, vols. 290-291, pt. 1, p. 120-123.)
Optical and magneto-optical spectroscopic ellipsometry of thin layers and nanostructures

Vlašín, Ondřej; Hrabovský, David; (Vysoká škola báňská - Technická univerzita Ostrava. Univerzitní studijní programy, Diplomová práce, 2009)

VLA07_USP_N3942_3942T001_2009.pdf
Optimization of a magneto-optical integrated isolator

Postava, Kamil; Višňovský, Štefan; Veis, Martin; Kolinský, Vratislav; Pištora, Jaromír; Ciprian, Dalibor; Gogol, P.; Beauvillain, Pierre (Journal of magnetism and magnetic materials. 2004, vol. 272-276, pt. 3, p. 2319-2320.)
Phase retrieval from the spectral interference signal used to measure thickness of SiO2 thin film on silicon wafer

Hlubina, Petr; Ciprian, Dalibor; Luňáček, Jiří; Chlebus, Radek (Applied physics. B, Lasers and optics. 2007, vol. 88, no. 3, p. 397-403.)
Spectral-domain measurement of phase modal birefringence in polarization-maintaining fiber

Hlubina, Petr; Ciprian, Dalibor (Optics express. 2007, vol. 15, issue 25, p. 17019-17024.)
Spectral-domain tandem interferometry to measure the group dispersion of optical samples

Chlebus, Radek; Hlubina, Petr; Ciprian, Dalibor (Optics and lasers in engineering. 2009, vol. 47, issue 1, p. 173-179.)

OPT-LASER-ENG-2009-47-1-173-chlebus.pdf
Spectral interferometric technique to measure the ellipsometric phase of a thin-film structure

Hlubina, Petr; Ciprian, Dalibor; Luňáček, Jiří (Optics letters. 2009, vol. 34, issue 17, p. 2661-2663.)

Hlubina_OL_v34p2661.pdf
Spectral interferometric technique to measure the relative phase change on reflection from a thin-film structure

Hlubina, Petr; Ciprian, Dalibor; Luňáček, Jiří (Applied physics, B. Lasers and optics. 2010, vol. 101, no. 4, p. 869-873.)

APPL-PHYS-B-LASERS-O-2010-101-4-869-hlubina.pdf
Spectral interferometry and reflectometry used for characterization of a multilayer mirror

Hlubina, Petr; Luňáček, Jiří; Ciprian, Dalibor (Optics letters. 2009, vol. 34, issue 10, p. 1564-1566.)

Hlubina_OL_v34p1564.pdf
Spectral interferometry and reflectometry used to measure thin films

Hlubina, Petr; Luňáček, Jiří; Ciprian, Dalibor; Chlebus, Radek (Applied physics, B. Lasers and Optics. 2008, vol. 92, no. 2, p. 203-207.)

APPL-PHYS-B-LASERS-O-2008-92-2-203-hlubina.pdf
Spectral interferometry-based chromatic dispersion measurement of fibre including the zero-dispersion wavelength

Hlubina, Petr; Kadulová, Miroslava; Ciprian, Dalibor (Journal of the European Optical Society – Rapid Publications. 2012, vol. 7, art. no. 12017.)

j-euro-opt-soc-rp-2012-7-12017-hlubina.pdf
Spektrální elipsometrie magneto-optických prostředí

Petružela, Martin; Ciprian, Dalibor; (Vysoká škola báňská - Technická univerzita Ostrava. Fakulta elektrotechniky a informatiky, Diplomová práce, 2006)
Surface crystallized Co66Fe4B15Si15 amorphous ribbons studied using magneto-optical magnetometry

Životský, Ondřej; Postava, Kamil; Kraus, Luděk; Malátek, Michal; Janičkovič, Dušan; Ciprian, Dalibor; Luňáček, Jiří; Pištora, Jaromír (Journal of magnetism and magnetic materials. 2005, vols. 290-291, pt. 1, p. 625-628.)
Theoretical model of the influence of oxide overlayer thickness on the performance of a surface plasmon fibre-optic sensor

Ciprian, Dalibor; Hlubina, Petr (Measurement science and technology. 2013, vol. 24, no. 2, art. no. 025105.)

measurement-science-technology-2013-24-2-025105-ciprian.pdf
Thickness of SiO2 thin film on silicon wafer measured by dispersive white-light spectral interferometry

Hlubina, Petr; Ciprian, Dalibor; Luňáček, Jiří; Lesňák, Michal (Applied physics. B, Lasers and optics. 2006, vol. 84, no. 3, p. 511-516.)
Waveguiding in Thin Films with Quadratic Magneto-Optical Medium

Pištora, Jaromír; Domański, A.; Bárta, Ondřej; Staněk, František; Postava, Kamil; Ciprian, Dalibor; Kopřiva, Igor (Acta physica Polonica, A : proceedings of the 5th International Workshop on Nonlinear Optics Applications. NOA 2000 , 8-11 June 2000, Grybow, Poland. 2001, vol. 99, no. 1, p. 17-23.)
White-light spectral interferometric technique to measure a nonlinear phase function of a thin-film structure

Hlubina, Petr; Luňáček, Jiří; Ciprian, Dalibor (Optics communications. 2010, vol. 283, issue 24, p. 4877-4881.)

OPT-COMMUN-2010-20-7-807-hlubina.pdf
Wide spectral range measurement of modal birefringence in polarization-maintaining fibres

Hlubina, Petr; Ciprian, Dalibor; Kadulová, Miroslava (Measurement science and technology. 2009, vol. 20, no. 2, art. no. 025301 (5pp).)

Now showing items 21-40 of 41

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