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dc.contributor.authorStejskal, Ondřej
dc.contributor.authorThiaville, André
dc.contributor.authorHamrle, Jaroslav
dc.contributor.authorFukami, Shunsuke
dc.contributor.authorOhno, Hideo
dc.date.accessioned2020-07-17T07:11:24Z
dc.date.available2020-07-17T07:11:24Z
dc.date.issued2020
dc.identifier.citationPhysical Review B. 2020, vol. 101, issue 23, art. no. 235437.cs
dc.identifier.issn2469-9950
dc.identifier.issn2469-9969
dc.identifier.urihttp://hdl.handle.net/10084/139649
dc.description.abstractThe in-plane current profile within multilayers of the generic structure Ta/Pt/(CoNi)/Pt/Ta is investigated. A large set of samples where the thickness of each layer was systematically varied was grown, followed by the measurement of the sheet resistance of each sample. The data are analyzed by a series of increasingly elaborate models, from a macroscopic engineering approach to mesoscopic transport theory. Non-negligible variations of the estimated repartition of current between the layers are found. The importance of having additional structural data is highlighted.cs
dc.language.isoencs
dc.publisherAmerican Physical Societycs
dc.relation.ispartofseriesPhysical Review Bcs
dc.relation.urihttp://doi.org/10.1103/PhysRevB.101.235437cs
dc.rights© 2020 American Physical Societycs
dc.titleCurrent distribution in metallic multilayers from resistance measurementscs
dc.typearticlecs
dc.identifier.doi10.1103/PhysRevB.101.235437
dc.type.statusPeer-reviewedcs
dc.description.sourceWeb of Sciencecs
dc.description.volume101cs
dc.description.issue23cs
dc.description.firstpageart. no. 235437cs
dc.identifier.wos000542512700004


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