Browsing Applied Physics. B, Lasers and Optics by Issue Date

DSpace/Manakin Repository

DSpace Home
Ústřední knihovna / Central Library (9830)
Publikační činnost v časopisech s IF podle JCR / Articles in journals with impact factor according to JCR
Applied Physics. B, Lasers and Optics
Browsing Applied Physics. B, Lasers and Optics by Issue Date

Browsing Applied Physics. B, Lasers and Optics by Issue Date

Now showing items 1-3 of 3

Spectral interferometric technique to measure the relative phase change on reflection from a thin-film structure

Hlubina, Petr; Ciprian, Dalibor; Luňáček, Jiří (Applied physics, B. Lasers and optics. 2010, vol. 101, no. 4, p. 869-873.)

APPL-PHYS-B-LASERS-O-2010-101-4-869-hlubina.pdf
The effect of silicon substrate on thickness of SiO2 thin film analysed by spectral reflectometry and interferometry

Hlubina, Petr; Luňáček, Jiří; Ciprian, Dalibor (Applied physics, B. Lasers and optics. 2009, vol. 95, no. 2, p. 795-799.)

APPL-PHYS-B-LASERS-O-2009-95-2-795-hlubina.pdf
Spectral interferometry and reflectometry used to measure thin films

Hlubina, Petr; Luňáček, Jiří; Ciprian, Dalibor; Chlebus, Radek (Applied physics, B. Lasers and Optics. 2008, vol. 92, no. 2, p. 203-207.)

APPL-PHYS-B-LASERS-O-2008-92-2-203-hlubina.pdf

Now showing items 1-3 of 3

Search DSpace

Advanced Search

Navigation

Browse

All of DSpace
This Collection
- By Issue Date
- Authors
- Titles
- Subjects

My Account

Login

Statistics

View Statistics