Spolehlivost programového vybavení pro obvody vysoké integrace a obvody velmi vysoké integrace

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Title: Spolehlivost programového vybavení pro obvody vysoké integrace a obvody velmi vysoké integrace
Next title: The software reliability of large scale integration circuit and very large scale integration circuit
Author: Ganiyev, Artem
Vitásek, Jan
Date issue: 2010
Citation: Advances in electrical and electronic engineering. 2010. vol. 8, no. 2, p. 48-53.
URI: http://hdl.handle.net/10084/84177
URI: http://advances.utc.sk/index.php/AEEE
ISSN: 1804-3119
Type: Article
Document version: publishedVersion
Access rights: openAccess
Rights: Creative Commons Attribution 3.0 Unported (CC BY 3.0)
© Vysoká škola báňská - Technická univerzita Ostrava
Rights: http://creativecommons.org/licenses/by/3.0/

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