| aaK citaci nebo jako odkaz na tento záznam použijte identifikátor: http://hdl.handle.net/10084/95000 |
| Title: | New sophisticated analysis method of crystallizer temperature profile utilizing optical fiber DTS based on the stimulated Raman scattering |
| Author: |
Koudelka, Petr
Liner, Andrej Papes, Martin Látal, Jan Vašinek, Vladimír Hurta, Jan Vinkler, Tomáš Šiška, Petr |
| Date issue: | 2012 |
| Citation: | Advances in electrical and electronic engineering. 2012, vol. 10, no. 2, p. 106-114. |
| URI: |
http://hdl.handle.net/10084/95000
|
| URI: |
http://advances.utc.sk/index.php/AEEE/article/download/637/775
|
| ISSN: | 1804-3119 |
| Type: | Article |
| Document version: | publishedVersion |
| Access rights: | openAccess |
| Rights: | © Vysoká škola báňská - Technická univerzita Ostrava Creative Commons Attribution 3.0 Unported (CC BY 3.0) |
| Files | Size | Format | View | Description |
|---|---|---|---|---|
| AEEE-2012-10-2-106-koudelka.pdf | 523.9Kb |
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publishedVersion |