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  • Spectroscopic ellipsometry on lamellar gratings 

    Antoš, Roman; Ohlídal, Ivan; Mistrík, Jan; Murakami, K.; Yamaguchi, Tomuo; Pištora, Jaromír; Horie, Masahiro; Višňovský, Štefan (Applied surface science. 2005, vol. 244, issues 1-4, p. 225-229.)