Spectroscopic ellipsometry of epitaxial ZnO layer on sapphire substrate

Author
Date
2000
Type
article
Location
Není ve fondu ÚK
ISSN
0021-8979
1089-7550
Metadata
Show full item record
Citation source document
Journal of Applied Physics. 2000, vol. 87, issue 11, p. 7820-7824.
Available at
http://dx.doi.org/10.1063/1.373461
URI
http://hdl.handle.net/10084/60825
Collections
Citace PRO