Method for increasing sensitivity of shear-force distance control for scanning near-field microscopy

Author
Date
1999
Type
article
Location
Není ve fondu ÚK
ISSN
0169-4332
Metadata
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Citation source document
Applied Surface Science. 1999, vol. 144-145, p. 510-513.
Available at
http://dx.doi.org/10.1016/S0169-4332(98)00850-2
URI
http://hdl.handle.net/10084/61578
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