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dc.contributor.authorPostava, Kamil
dc.contributor.authorHrabovský, David
dc.contributor.authorPištora, Jaromír
dc.contributor.authorFert, A. R.
dc.contributor.authorVišňovský, Štefan
dc.identifier.citationJournal of applied physics. 2002, vol. 91, issue 10, p. 7293-7295.en
dc.publisherAmerican Institute of Physicsen
dc.relation.ispartofseriesJournal of applied physicsen
dc.titleAnisotropy of quadratic magneto-optic effects in reflectionen
dc.identifier.locationNení ve fondu ÚKen
dc.description.abstract-enQuadratic or second-order magneto-optic effects in reflection significantly effect in-plane magnetization measurements. While the magneto-optic effects linear in magnetization are independent of orientation of cubic crystal axes, the amplitude and sign of the quadratic effects change significantly under crystal rotation. Theoretical formulas for the magneto-optic effects have been derived using a permittivity tensor including terms quadratic in magnetization. A method for separation of the diagonal and off-diagonal quadratic magneto-optic tensor components (G11–G12) and 2G44 is proposed. The theory was completed by an experimental observation of the quadratic effect anisotropy in an epitaxial Fe layer prepared on a MgO substrate. The influence of the magnetization components on the magneto-optic vector magnetometry is discussed for an interface, a single layer, and exchange coupled bilayer system for a general magnetization direction including the quadratic magneto-optic effect anisotropy.

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