Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film

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Title: Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film
Author: Hlubina, Petr
Ciprian, Dalibor
Luňáček, Jiří
Lesňák, Michal
Date issue: 2006
Citation: Optics express. 2006, vol. 14, issue 17, p. 7678-7685.
Rights: © 2006 Optical Society of America
This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OE.14.007678. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
URI: http://hdl.handle.net/10084/60633
ISSN: 1094-4087
DOI: 10.1364/OE.14.007678
URI: http://dx.doi.org/10.1364/OE.14.007678
Type: article
Document version: publishedVersion
Access rights: openAccess
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