Doping effects on optical properties of epitaxial ZnO layers determined by spectroscopic ellipsometry

Doping effects on optical properties of epitaxial ZnO layers determined by spectroscopic ellipsometry

DSpace/Manakin Repository

aaK citaci nebo jako odkaz na tento záznam použijte identifikátor: http://hdl.handle.net/10084/60828

dc.contributor.author	Postava, Kamil
dc.contributor.author	Sueki, H.
dc.contributor.author	Aoyama, Mitsuru
dc.contributor.author	Yamaguchi, Tomuo
dc.contributor.author	Murakami, K.
dc.contributor.author	Igasaki, Y.
dc.date.accessioned	2007-07-02T09:10:32Z
dc.date.available	2007-07-02T09:10:32Z
dc.date.issued	2001
dc.identifier.citation	Applied surface science. 2001, vols. 175-176, p. 543-548.	en
dc.identifier.issn	0169-4332
dc.identifier.uri	http://hdl.handle.net/10084/60828
dc.language.iso	en	en
dc.publisher	North-Holland	en
dc.relation.ispartofseries	Applied surface science	en
dc.relation.uri	http://dx.doi.org/10.1016/S0169-4332(01)00145-3	en
dc.subject	ZnO	en
dc.subject	spectroscopic ellipsometry	en
dc.subject	reflectivity	en
dc.subject	surface roughness	en
dc.title	Doping effects on optical properties of epitaxial ZnO layers determined by spectroscopic ellipsometry	en
dc.type	Article	en
dc.identifier.location	Není ve fondu ÚK	en
dc.description.abstract-en	Optical properties of Al- and Ga-doped ZnO layers have been studied in the spectral range from 1.5 to 5.4 eV using a four-zone null spectroscopic ellipsometer and in the spectral range from 0.5 to 6.5 eV using near-normal incidence reflectivity measurements. The layers were prepared by RF magnetron sputtering onto (1 1 0) oriented single-crystal sapphire substrates. Al- and Ga-doping gives rise to a shift of the fundamental absorption edge from 3.4 to 3.7 eV. The model dielectric function (MDF) based on an excitonic structure derived by Tanguy [Phys. Rev. B 60 (1999) 10660] was completed by the Sellmeier and Drude terms. The Drude term describes a free-electron contribution originating from presence of the dopant. Spectroscopic ellipsometry and reflectometry are very sensitive to a surface roughness. The surface roughness was modeled by a surface layer of the Bruggeman effective medium and by diffraction theory.	en
dc.identifier.doi	10.1016/S0169-4332(01)00145-3
dc.identifier.wos	000169032100090

Files in this item

Files	Size	Format	View
There are no files associated with this item.

This item appears in the following Collection(s)

Publikační činnost VŠB-TUO / Publications of VŠB-TUO [1643]
Kolekce obsahuje bibliografické záznamy publikační činnosti (článků) akademických pracovníků VŠB-TUO v časopisech (a v Lecture Notes in Computer Science) registrovaných ve Web of Science od roku 1990 po současnost.

Show simple item record