Spectral interferometric technique to measure the ellipsometric phase of a thin-film structure

DSpace/Manakin Repository

aaK citaci nebo jako odkaz na tento záznam použijte identifikátor: http://hdl.handle.net/10084/76146

Show full item record


Title: Spectral interferometric technique to measure the ellipsometric phase of a thin-film structure
Author: Hlubina, Petr
Ciprian, Dalibor
Luňáček, Jiří
Date issue: 2009
Citation: Optics letters. 2009, vol. 34, issue 17, p. 2661-2663.
URI: http://hdl.handle.net/10084/76146
ISSN: 0146-9592
1539-4794
DOI: 10.1364/OL.34.002661
URI: http://dx.doi.org/10.1364/OL.34.002661
Type: article
Document version: submittedVersion
Access rights: openAccess
Počet citací dokumentu:

Files in this item

Files Size Format View Description
Hlubina_OL_v34p2661.pdf 222.1Kb PDF View/Open postprint

This item appears in the following Collection(s)

Show full item record

Search DSpace


Advanced Search

Navigation

Browse

My Account

Statistics