Spectral interferometric technique to measure the relative phase change on reflection from a thin-film structure

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Title: Spectral interferometric technique to measure the relative phase change on reflection from a thin-film structure
Author: Hlubina, Petr
Ciprian, Dalibor
Luňáček, Jiří
Date issue: 2010
Citation: Applied physics, B. Lasers and optics. 2010, vol. 101, no. 4, p. 869-873.
URI: http://hdl.handle.net/10084/83521
ISSN: 0946-2171
1432-0649
DOI: 10.1007/s00340-010-4122-7
URI: http://dx.doi.org/10.1007/s00340-010-4122-7
Type: Article
Document version: submittedVersion
Access rights: openAccess Fulltext Request
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