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dc.contributor.authorJurečka, Stanislav
dc.contributor.authorHavlík, Milan
dc.contributor.authorJurečková, Mária
dc.date.accessioned2011-01-18T11:19:10Z
dc.date.available2011-01-18T11:19:10Z
dc.date.issued2004
dc.identifier.citationAdvances in electrical and electronic engineering. 2004, vol. 3, no. 1, p. 27-30.en
dc.identifier.issn1336-1376
dc.identifier.urihttp://hdl.handle.net/10084/83641
dc.format.extent142650 bytescs
dc.format.mimetypeapplication/pdfcs
dc.language.isosken
dc.publisherŽilinská univerzita v Žiline. Elektrotechnická fakultaen
dc.relation.ispartofseriesAdvances in electrical and electronic engineeringen
dc.relation.urihttp://advances.utc.sk/index.php/AEEEen
dc.rightsCreative Commons Attribution 3.0 Unported (CC BY 3.0)en
dc.rights© Žilinská univerzita v Žiline. Elektrotechnická fakultaen
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en
dc.titleGenetická syntéza difrakcného profiluen
dc.title.alternativeGenetic synthesis of the diffraction profileen
dc.typearticleen
dc.description.abstract-enIn this paper we describe theoretical synthesis of the x-ray diffraction line profile as a superposition of the spectral components Ka1 and Ka2 optimized to the experimental data by the genetic algorithm and nonlinear optimization methods 'Nelder-Mead downhill simplex' and Levenberg-Marquardt method. Such combination of global and local optimization methods results in a mathematical model of the diffraction profile, providing reliable determininig of diffraction line characteristics for the material structure properties study. Experimetal results of the optimization preocedures are given too.en
dc.rights.accessopenAccess
dc.type.versionpublishedVersioncs
dc.type.statusPeer-reviewedcs


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  • AEEE. 2004, vol. 3 [33]
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Creative Commons Attribution 3.0 Unported (CC BY 3.0)
Except where otherwise noted, this item's license is described as Creative Commons Attribution 3.0 Unported (CC BY 3.0)