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dc.contributor.authorJurečka, Stanislav
dc.contributor.authorHavlík, Milan
dc.contributor.authorJurečková, Mária
dc.identifier.citationAdvances in electrical and electronic engineering. 2004, vol. 3, no. 1, p. 27-30.en
dc.format.extent142650 bytescs
dc.publisherŽilinská univerzita v Žiline. Elektrotechnická fakultaen
dc.relation.ispartofseriesAdvances in electrical and electronic engineeringen
dc.rightsCreative Commons Attribution 3.0 Unported (CC BY 3.0)en
dc.rights© Žilinská univerzita v Žiline. Elektrotechnická fakultaen
dc.titleGenetická syntéza difrakcného profiluen
dc.title.alternativeGenetic synthesis of the diffraction profileen
dc.description.abstract-enIn this paper we describe theoretical synthesis of the x-ray diffraction line profile as a superposition of the spectral components Ka1 and Ka2 optimized to the experimental data by the genetic algorithm and nonlinear optimization methods 'Nelder-Mead downhill simplex' and Levenberg-Marquardt method. Such combination of global and local optimization methods results in a mathematical model of the diffraction profile, providing reliable determininig of diffraction line characteristics for the material structure properties study. Experimetal results of the optimization preocedures are given too.en

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  • AEEE. 2004, vol. 3 [33]
  • OpenAIRE [2691]
    Kolekce určená pro sklízení infrastrukturou OpenAIRE; obsahuje otevřeně přístupné publikace, případně další publikace, které jsou výsledkem projektů rámcových programů Evropské komise (7. RP, H2020).

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Creative Commons Attribution 3.0 Unported (CC BY 3.0)
Except where otherwise noted, this item's license is described as Creative Commons Attribution 3.0 Unported (CC BY 3.0)