Experimental Analysis of Communitation Process of Power Semiconductor Transistor’s Structures

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dc.contributor.author Špánik, Pavol
dc.contributor.author Dobrucký, Branislav
dc.contributor.author Frívaldský, Michal
dc.contributor.author Drgoňa, Peter
dc.contributor.author Lokšeninec, Ivan
dc.date.accessioned 2011-02-03T09:39:54Z
dc.date.available 2011-02-03T09:39:54Z
dc.date.issued 2007
dc.identifier.citation Advances in electrical and electronic engineering. 2007, vol. 6, no. 1, p. 50-53. en
dc.identifier.issn 1336-1376
dc.identifier.uri http://hdl.handle.net/10084/83865
dc.description.abstract The paper deals with testing device designed for experimental examination of processes in power electronics devices during various switching modes is described. Through the use of auxiliary circuits additional switching modes (ZVS, ZCS) are realized except hard switching, and turning-off with reduced current respectively. The device´s advantage is possibility of fine dead time setting, allowing us analyzing the effects of phenomenon noted above, on measurements of commutation losses. en
dc.format.extent 174234 bytes cs
dc.format.mimetype application/pdf cs
dc.language.iso en en
dc.publisher Žilinská univerzita v Žiline. Elektrotechnická fakulta en
dc.relation.ispartofseries Advances in electrical and electronic engineering en
dc.relation.uri http://advances.utc.sk/index.php/AEEE en
dc.rights Creative Commons Attribution 3.0 Unported (CC BY 3.0)
dc.rights © Žilinská univerzita v Žiline. Elektrotechnická fakulta
dc.rights.uri http://creativecommons.org/licenses/by/3.0/
dc.title Experimental Analysis of Communitation Process of Power Semiconductor Transistor’s Structures en
dc.type Article en
dc.rights.access openAccess cs
dc.type.version publishedVersion cs
dc.type.status Peer-reviewed cs

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