White-light spectral interferometric technique to measure a nonlinear phase function of a thin-film structure

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Title: White-light spectral interferometric technique to measure a nonlinear phase function of a thin-film structure
Author: Hlubina, Petr
Luňáček, Jiří
Ciprian, Dalibor
Date issue: 2010
Citation: Optics communications. 2010, vol. 283, issue 24, p. 4877-4881.
URI: http://hdl.handle.net/10084/84368
ISSN: 0030-4018
DOI: 10.1016/j.optcom.2010.07.038
URI: http://dx.doi.org/10.1016/j.optcom.2010.07.038
Type: article
Document version: submittedVersion
Access rights: openAccess Fulltext Request
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