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dc.contributor.authorHamrlová, Jana
dc.contributor.authorPostava, Kamil
dc.contributor.authorŽivotský, Ondřej
dc.contributor.authorHrabovský, David
dc.contributor.authorPištora, Jaromír
dc.contributor.authorŠvec, Peter
dc.contributor.authorMaziewski, Andrzej
dc.date.accessioned2011-03-21T13:34:01Z
dc.date.available2011-03-21T13:34:01Z
dc.date.issued2010
dc.identifier.citationPhysica Polonica A. 2010, vol. 118, issue 5, p. 837-839.en
dc.identifier.issn0587-4246
dc.identifier.issn1898-794X
dc.identifier.urihttp://hdl.handle.net/10084/84388
dc.description.abstractRecently, we have shown that the approach of depth sensitivity of magneto-optic ellipsometry can be generalized to selectivity from different materials in nanostructures. We use the condition number as the figure of merit to quantify the magneto-optic selectivity to two different magnetic contributions in magnetic nanostructure. The method is demonstrated on nanostructures containing magnetically hard Fe particles in surface layer of soft FeNbB amorphous ribbon. We separated both magnetic contributions from measurement of hysteresis loops using magneto-optic Kerr effect in longitudinal configuration. Magneto-optic selectivity is discussed and theoretical model on the basis of effective medium is compared with experimental data of longitudinal magneto-optic Kerr effect depending on angle of incidence.en
dc.language.isoenen
dc.publisherPolska Akademia Nauk. Instytut fizykien
dc.relation.ispartofseriesPhysica Polonica Aen
dc.relation.urihttp://przyrbwn.icm.edu.pl/APP/PDF/118/a118z5p051.pdfen
dc.titleEllipsometric selective sensitivity to magnetic nanostructures actaen
dc.typearticleen
dc.identifier.locationNení ve fondu ÚKen
dc.identifier.wos000285797100052


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