Comprehensive study of solar cell structure defects by means of noise and light emission analysis

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dc.contributor.author Macků, Robert
dc.contributor.author Koktavý, Pavel
dc.contributor.author Sicner, Jiří
dc.date.accessioned 2012-09-10T08:38:50Z
dc.date.available 2012-09-10T08:38:50Z
dc.date.issued 2012
dc.identifier.citation Advances in electrical and electronic engineering. 2012, vol. 10, no. 2, p. 130-135. cs
dc.identifier.issn 1804-3119
dc.identifier.uri http://hdl.handle.net/10084/95007
dc.description.abstract This paper discusses the issue of silicon solar cells localized defects from metrological and physical points of view. Structure imperfections represent the real problem because of solar cells long-term degradation and conversion efficiency decreasing. To this aim we pay our attention to research relating to the defect light emission and correlation with rectangular microplasma fluctuation. A sensitive CCD camera has been used for mapping of surface photon emission. The operation point of the samples has been set to reverse bias mode, and different electric field intensity was applied. We managed to get interesting information using a combination of optical investigation and electrical noise measurement in time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists and the results related to several defect spots are presented in detail in this paper. cs
dc.format.extent 772160 bytes cs
dc.format.mimetype application/pdf cs
dc.language.iso en cs
dc.publisher Vysoká škola báňská - Technická univerzita Ostrava cs
dc.relation.ispartofseries Advances in electrical and electronic engineering cs
dc.relation.uri http://advances.utc.sk/index.php/AEEE/article/download/620/780 cs
dc.rights © Vysoká škola báňská - Technická univerzita Ostrava
dc.rights Creative Commons Attribution 3.0 Unported (CC BY 3.0)
dc.subject solar cell cs
dc.subject local defect cs
dc.subject electric noise cs
dc.subject light emission cs
dc.title Comprehensive study of solar cell structure defects by means of noise and light emission analysis cs
dc.type article cs
dc.rights.access openAccess cs
dc.type.version publishedVersion cs
dc.type.status Peer-reviewed cs

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