Prohlížení dle autora "Drevillon, Bernard"
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Critical dimension of biperiodic gratings determined by spectral ellipsometry and Mueller matrix polarimetry
Foldyna, Martin; De Martino, Antonello; Garcia-Caurel, Enric; Ossikovski, Razvigor; Licitra, Christophe; Bertin, François; Postava, Kamil; Drevillon, Bernard (European Physical Journal Applied Physics. 2008, vol. 42, issue 3, p. 351-359.) -
Effective medium approximation of anisotropic lamellar nanogratings based on Fourier factorization
Foldyna, Martin; Ossikovski, Razvigor; De Martino, Antonello; Drevillon, Bernard; Postava, Kamil; Ciprian, Dalibor; Pištora, Jaromír; Watanabe, Koki (Optics Express. 2006, vol. 14, issue 8, p. 3114-3128.) -
Monitoring critical dimensions of bidimensional gratings by spectroscopic ellipsometry and Mueller polarimetry
Foldyna, Martin; De Martino, Antonello; Garcia-Caurel, Enric; Ossikovski, Razvigor; Bertin, François; Hazart, Jérôme; Postava, Kamil; Drevillon, Bernard (physica status solidi (a). 2008, vol. 205, issue 4, p. 806-809.)