Prohlížení dle autora "Igasaki, Y."
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Doping effects on optical properties of epitaxial ZnO layers determined by spectroscopic ellipsometry
Postava, Kamil; Sueki, H.; Aoyama, Mitsuru; Yamaguchi, Tomuo; Murakami, K.; Igasaki, Y. (Applied Surface Science. 2001, vols. 175-176, p. 543-548.) -
Spectroscopic ellipsometry of epitaxial ZnO layer on sapphire substrate
Postava, Kamil; Sueki, H.; Aoyama, Mitsuru; Yamaguchi, Tomuo; Ino, Ch.; Igasaki, Y.; Horie, Masahiro (Journal of Applied Physics. 2000, vol. 87, issue 11, p. 7820-7824.)