Prohlížení dle autora "Ino, Ch."
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Spectroscopic ellipsometry of epitaxial ZnO layer on sapphire substrate
Postava, Kamil; Sueki, H.; Aoyama, Mitsuru; Yamaguchi, Tomuo; Ino, Ch.; Igasaki, Y.; Horie, Masahiro (Journal of Applied Physics. 2000, vol. 87, issue 11, p. 7820-7824.)