Prohlížení dle autora "Kildemo, Morten"
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Diffractive order Mueller matrix ellipsometry for the design and manufacture of polarization beam splitting metasurfaces
Bjelland, Victoria M.; Hale, Nathan; Schwarz, Niklas; Vala, Daniel; Høvik, Jens; Kildemo, Morten (Optics Express. 2024, vol. 32, issue 1, art. no. 501709.) -
Effects of optical activity to Mueller matrix ellipsometry of composed waveplates
Vala, Daniel; Koleják, Pierre; Postava, Kamil; Kildemo, Morten; Provazníková, Pavlína; Pištora, Jaromír (Optics Express. 2021, vol. 29, issue 7, p. 10434-10450.) -
Modeling and characterization of materials and nanostructures for photovoltaic applications.
Mrázková, Zuzana (Disertační práce, 2017) -
Optical activity measurement using Mueller matrix ellipsometry
Vala, Daniel (Diplomová práce, 2020)