Prohlížení dle autora "Madani, Mohammad"
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Ofstatistical and fractal properties of semiconductor surface roughness
Jurečka, Stanislav; Jurečková, Mária; Kobayashi, Hikaru; Takahashi, Masao; Madani, Mohammad; Pinčík, Emil (Advances in electrical and electronic engineering. 2008, vol. 7, no. 1, 2, p. 377-381.)