Prohlížení dle autora "Mishra, Ram Awadh"
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Perspective of buried oxide thickness variation on triple metal-gate (TMG) recessed-S/D FD-SOI MOSFET
Priya, Anjali; Srivastava, Nilesh Anand; Mishra, Ram Awadh (Advances in electrical and electronic engineering. 2018, vol. 16, no. 3, p. 380-386 : ill.)