Prohlížení dle autora "Murakami, K."
-
Doping effects on optical properties of epitaxial ZnO layers determined by spectroscopic ellipsometry
Postava, Kamil; Sueki, H.; Aoyama, Mitsuru; Yamaguchi, Tomuo; Murakami, K.; Igasaki, Y. (Applied Surface Science. 2001, vols. 175-176, p. 543-548.) -
Spectroscopic ellipsometry on lamellar gratings
Antoš, Roman; Ohlídal, Ivan; Mistrík, Jan; Murakami, K.; Yamaguchi, Tomuo; Pištora, Jaromír; Horie, Masahiro; Višňovský, Štefan (Applied Surface Science. 2005, vol. 244, issues 1-4, p. 225-229.)