Prohlížení dle autora "Ossikovski, Razvigor"

Critical dimension of biperiodic gratings determined by spectral ellipsometry and Mueller matrix polarimetry

Foldyna, Martin; De Martino, Antonello; Garcia-Caurel, Enric; Ossikovski, Razvigor; Licitra, Christophe; Bertin, François; Postava, Kamil; Drevillon, Bernard (European Physical Journal Applied Physics. 2008, vol. 42, issue 3, p. 351-359.)

Effective medium approximation of anisotropic lamellar nanogratings based on Fourier factorization

Foldyna, Martin; Ossikovski, Razvigor; De Martino, Antonello; Drevillon, Bernard; Postava, Kamil; Ciprian, Dalibor; Pištora, Jaromír; Watanabe, Koki (Optics Express. 2006, vol. 14, issue 8, p. 3114-3128.)

Effective spectral optical functions of lamellar nanogratings

Foldyna, Martin; Postava, Kamil; Ossikovski, Razvigor; De Martino, Antonello; Garcia-Caurel, Enric (Journal of the European Optical Society-Rapid Publications. 2006, vol. 1, article no. 06015.)

Monitoring critical dimensions of bidimensional gratings by spectroscopic ellipsometry and Mueller polarimetry

Foldyna, Martin; De Martino, Antonello; Garcia-Caurel, Enric; Ossikovski, Razvigor; Bertin, François; Hazart, Jérôme; Postava, Kamil; Drevillon, Bernard (physica status solidi (a). 2008, vol. 205, issue 4, p. 806-809.)

Null ellipsometer with phase modulation

Postava, Kamil; Maziewski, Andrzej; Yamaguchi, Tomuo; Ossikovski, Razvigor; Višňovský, Štefan; Pištora, Jaromír (Optics Express. 2004, vol. 12, issue 24, p. 6040-6045.)