Prohlížení dle autora "Postava, Kamil"
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360° polarization control of terahertz spintronic emitters using uniaxial FeCo/TbCo2/FeCo trilayers
Koleják, Pierre; Lezier, Geoffrey; Postava, Kamil; Lampin, Jean-François; Tiercelin, Nicolas; Vanwolleghem, Mathias (ACS Photonics. 2022, vol. 9, issue 4, p. 1274-1285.) -
A shape optimization method for nonlinear axisymmetric magnetostatics using a coupling of finite and boundary elements
Lukáš, Dalibor; Postava, Kamil; Životský, Ondřej (Mathematics and Computers in Simulation. 2012, vol. 82, issue 10, p. 1721-1731.) -
Analysis of wire-grid polarisers in terahertz spectral range
Mičica, Martin; Bucko, Václav; Postava, Kamil; Vanwolleghem, Mathias; Lampin, Jean-François; Pištora, Jaromír (Journal of Nanoscience and Nanotechnology. 2016, vol. 16, no. 8, p. 7810-7813.) -
Anisotropy of magneto-optical spectra in ultrathin Fe/Au/Fe bilayers
Gřondilová, Jana; Rickart, M.; Mistrík, Jan; Postava, Kamil; Višňovský, Štefan; Lopušník, Radek; Demokritov, S.O.; Hillebrands, B. (Journal of Applied Physics. 2002, vol. 91, issue 10, p. 8246-8248.) -
Anisotropy of quadratic magneto-optic effects in reflection
Postava, Kamil; Hrabovský, David; Pištora, Jaromír; Fert, A. R.; Višňovský, Štefan (Journal of Applied Physics. 2002, vol. 91, issue 10, p. 7293-7295.) -
Astigmatický Gaussův svazek a jeho transformace optickou soustavou
Dostálová, Libuše (Diplomová práce, 2003) -
Asymmetric giant magnetoimpedance in stress-field annealed CoFeBSi amorphous ribbons
Kraus, Luděk; Malátek, Michal; Postava, Kamil; Janičkovič, Dušan (Journal of Magnetism and Magnetic Materials. 2005, vols. 290-291, pt. 2, p. 1131-1133.) -
Broadband Mueller ellipsometer as an all-in-one tool for spectral and temporal analysis of mutarotation kinetics
Vala, Daniel; Mičica, Martin; Cvejn, Daniel; Postava, Kamil (RSC Advances. 2023, vol. 13, issue 10, p. 6582-6592.) -
Calculated reflection coefficients of a single planar interface with an optically biaxial Cu(en)(H2O)(2)SO4 material compared to experiment
Sýkora, Rudolf; Postava, Kamil; Legut, Dominik; Tarasenko, R. (Journal of Nanoscience and Nanotechnology. 2016, vol. 16, no. 8, p. 7818-7821.) -
Characterization of organic low-dielectric-constant materials using optical spectroscopy
Postava, Kamil; Yamaguchi, Tomuo; Nakano, T. (Optics Express. 2001, vol. 9, issue 3, p. 141-151.) -
Characterization of special anisotropic structures using Mueller matrix ellipsometry
Vala, Daniel (Bakalářská práce, 2018) -
Coherent light sources with spin-polarized current.
Fördös, Tibor (Disertační práce, 2018) -
Color effects in optical spectroscopy
Kunčická, Šárka (Bakalářská práce, 2014) -
Coupled mode enhanced giant magnetoplasmonics transverse Kerr effect
Halagačka, Lukáš; Vanwolleghem, Mathias; Postava, Kamil; Dagens, Beatrice; Pištora, Jaromír (Optics Express. 2013, vol. 21, issue 19, p. 21741-21755.) -
Critical dimension of biperiodic gratings determined by spectral ellipsometry and Mueller matrix polarimetry
Foldyna, Martin; De Martino, Antonello; Garcia-Caurel, Enric; Ossikovski, Razvigor; Licitra, Christophe; Bertin, François; Postava, Kamil; Drevillon, Bernard (European Physical Journal Applied Physics. 2008, vol. 42, issue 3, p. 351-359.) -
Dark mode spectroscopy of magnetic thin films
Pištora, Jaromír; Ciprian, Dalibor; Kantor, Roman; Postava, Kamil; Sobota, Jaroslav (Journal of Magnetism and Magnetic Materials. 1996, vol. 157-158, p. 283-284.) -
Dependence on growth conditions of surface anisotropy and magnetization reversal in Au/Co (0.8 nm)/Au/MoS2
Ortega, M. D.; Raquet, B.; Postava, Kamil; Armand, C.; Mamy, R.; Goiran, M.; Fert, A. R. (Journal of Magnetism and Magnetic Materials. 1997, vol. 165, issues 1-3, p. 487-491.) -
Depolarizace ve spektroskopické elipsometrii
Chochol, Jan (Bakalářská práce, 2010) -
Deposition and characterization of Y-substituted BIG thin films
Kunčická, Šárka (Diplomová práce, 2016) -
Depth and material sensitivity in magneto-optic nanostructures
Postava, Kamil; Hamrle, Jaroslav; Hamrlová, Jana; Hrabovský, David; Životský, Ondřej; Pištora, Jaromír; Lukáš, Dalibor (International Journal of Nanotechnology. 2012, vol. 9, no. 8-9, p. 784-808.)