Prohlížení dle autora "Torres-Rios, A."
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In-situ spectroscopic ellipsometry of microcrystalline silicon deposited by plasma-enhanced chemical vapor deposition on flexible Fe-Ni alloy substrate for photovoltaic applications
Mrázková, Zuzana; Torres-Rios, A.; Ruggeri, Rosa; Foldyna, Martin; Postava, Kamil; Pištora, Jaromír; Roca i Cabarrocas, Pere (Thin Solid Films. 2014, vol. 571, part 3, p. 749-755.)