Browsing by Author "Vala, Daniel"
Now showing items 1-10 of 10
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Broadband Mueller ellipsometer as an all-in-one tool for spectral and temporal analysis of mutarotation kinetics
Vala, Daniel; Mičica, Martin; Cvejn, Daniel; Postava, Kamil (RSC Advances. 2023, vol. 13, issue 10, p. 6582-6592.) -
Characterization of special anisotropic structures using Mueller matrix ellipsometry
Vala, Daniel (Bakalářská práce, 2018) -
Diffractive order Mueller matrix ellipsometry for the design and manufacture of polarization beam splitting metasurfaces
Bjelland, Victoria M.; Hale, Nathan; Schwarz, Niklas; Vala, Daniel; Høvik, Jens; Kildemo, Morten (Optics Express. 2024, vol. 32, issue 1, art. no. 501709.) -
Effects of optical activity to Mueller matrix ellipsometry of composed waveplates
Vala, Daniel; Koleják, Pierre; Postava, Kamil; Kildemo, Morten; Provazníková, Pavlína; Pištora, Jaromír (Optics Express. 2021, vol. 29, issue 7, p. 10434-10450.) -
Mueller matrix ellipsometry of waveplates for control of their properties and alignment
Koleják, Pierre; Vala, Daniel; Postava, Kamil; Provazníková, Pavlína; Pištora, Jaromír (Journal of Vacuum Science & Technology B. 2020, vol. 38, issue 1, art. no. 014006.) -
Mueller matrix polarimetry of advanced structures with special optical response
Vala, Daniel (Disertační práce, 2025) -
Násobič proudu
Vala, Daniel (Diplomová práce, 2002) -
Okružní křižovatka na silnici I/14 ve Vrchlabí
Vala, Daniel (Bakalářská práce, 2012) -
One-dimensional photonic crystal for Bloch surface waves and radiation modes-based sensing
Gryga, Michal; Vala, Daniel; Koleják, Pierre; Gembalová, Lucie; Ciprian, Dalibor; Hlubina, Petr (Optical Materials Express. 2019, vol. 9, issue 10, p. 4009-4022.) -
Optical activity measurement using Mueller matrix ellipsometry
Vala, Daniel (Diplomová práce, 2020)