| dc.contributor.author | Postava, Kamil | |
| dc.contributor.author | Pištora, Jaromír | |
| dc.contributor.author | Kojima, Masashi | |
| dc.contributor.author | Kikuchi, Kazuo | |
| dc.contributor.author | Endo, Kazuhiro | |
| dc.contributor.author | Yamaguchi, Tomuo | |
| dc.date.accessioned | 2006-10-26T11:50:08Z | |
| dc.date.available | 2006-10-26T11:50:08Z | |
| dc.date.issued | 2003 | |
| dc.identifier.citation | Optics Express. 2003, vol. 11, issue 6, p. 610-616. | en |
| dc.identifier.issn | 1094-4087 | |
| dc.identifier.uri | http://hdl.handle.net/10084/57431 | |
| dc.description.abstract | A method for thickness monitoring and turning-point prediction during deposition of narrow band pass optical filters (NBPF) for dense-wavelength-division-multiplexing (DWDM) applications is proposed. The method is based on a recurrent approach, with relative transmittance .tting, and includes partial coherence and monochromator bandpass e.ects. We show that the partial coherence e.ects in thin .lm structures are signi.cant and can not be neglected. The proposed method is applicable for precise thickness monitoring and deposition control of any complex multilayer coating. | en |
| dc.format.extent | 192397 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en | en |
| dc.publisher | Optical Society of America | en |
| dc.relation.ispartofseries | Optics Express | en |
| dc.relation.uri | https://doi.org/10.1364/OE.11.000610 | en |
| dc.rights | © 2003 Optical Society of America | |
| dc.rights | This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OE.11.000610. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law. | |
| dc.subject | and multiplexers | |
| dc.subject | switches | |
| dc.subject | couplers | |
| dc.subject | multiplexing | |
| dc.subject | coatings | |
| dc.subject | deposition and fabrication | |
| dc.subject | fiber optics and optical communications | |
| dc.subject | thin films | |
| dc.title | Thickness monitoring of optical filters for DWDM applications | en |
| dc.type | article | en |
| dc.identifier.location | Není ve fondu ÚK | en |
| dc.identifier.doi | 10.1364/OE.11.000610 | |
| dc.rights.access | openAccess | |
| dc.type.version | publishedVersion | |
| dc.identifier.wos | 000181765500014 | |