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dc.contributor.authorJaworowicz, Jerzy
dc.contributor.authorKurant, Zbigniew
dc.contributor.authorPostava, Kamil
dc.contributor.authorMaziewski, Andrzej
dc.contributor.authorBaczewski, Lech T.
dc.contributor.authorWawro, Andrzej
dc.date.accessioned2006-11-02T06:52:26Z
dc.date.available2006-11-02T06:52:26Z
dc.date.issued2006
dc.identifier.citationMaterials Science-Poland. 2006, vol. 24, no. 3, p. 639-642.en
dc.identifier.issn0137-1339
dc.identifier.urihttp://hdl.handle.net/10084/57669
dc.description.abstractThe magnetization reversal and domain structures in thin Co films in the thickness range 2 nm<d<100 nm whith in-plane magnetic anisotropy were studied. Both magneto-optical (MO) vector magnetometry and MO microscopy were used. The crossover of in-plane anisotropy symmetry from two-fold to six-fold were observed with increase of Co layer thickness from 2 nm to 100 nm. The evolution of the domain structure during the magnetization reversal process was studied for different orientations of magnetic field relatively to anisotropy easy axis using longitudinal Kerr MO microscope.en
dc.language.isoenen
dc.publisherOficyna Wydawnicza Politechniki Wrocławskiejen
dc.relation.ispartofseriesMaterials Science-Polanden
dc.subjectmagnetization reversalen
dc.subjectdomain structureen
dc.subjectKerr effecten
dc.subjectmagneto-optic vector magnetometryen
dc.titleDomain structures and magnetization processes in thin Co films with in-plane anisotropyen
dc.typearticleen
dc.identifier.locationNení ve fondu ÚKen
dc.identifier.wos000241167400016


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