| dc.contributor.author | Postava, Kamil | |
| dc.contributor.author | Yamaguchi, Tomuo | |
| dc.contributor.author | Kantor, Roman | |
| dc.date.accessioned | 2006-11-03T07:56:37Z | |
| dc.date.available | 2006-11-03T07:56:37Z | |
| dc.date.issued | 2002 | |
| dc.identifier.citation | Applied Optics. 2002, vol. 41, issue 13, p. 2521-2531. | en |
| dc.identifier.issn | 0003-6935 | |
| dc.identifier.issn | 1539-4522 | |
| dc.identifier.uri | http://hdl.handle.net/10084/57720 | |
| dc.description.abstract | We propose a matrix method for the description of light reflection and transmission by an anisotropic multilayer system consisting of thin and thick layers. A method based on partial-wave matrix summations is applicable in the field of reflection and transmission photometry and ellipsometry. In the case of a thin anisotropic film, the interference effects were described by use of a coherent summation of Jones matrices. Incoherent intensity summations for a thick weakly anisotropic layer were characterized by use of the coherency vector formalism. Observable quantities or Mueller matrix components were obtained from the matrix describing transformation of the coherence vectors. | en |
| dc.language.iso | en | en |
| dc.publisher | Optical Society of America | en |
| dc.relation.ispartofseries | Applied Optics | en |
| dc.relation.uri | https://doi.org/10.1364/AO.41.002521 | en |
| dc.subject | and metrology | en |
| dc.subject | measurement | en |
| dc.subject | instrumentation | en |
| dc.subject | ellipsometryand polarimetry | en |
| dc.subject | physical optics | en |
| dc.subject | anisotropic media (crystal optics) | en |
| dc.subject | birefringence | en |
| dc.title | Matrix description of coherent and incoherent light reflection and transmission by anisotropic multilayer structures | en |
| dc.type | article | en |
| dc.identifier.location | Není ve fondu ÚK | en |
| dc.identifier.doi | 10.1364/AO.41.002521 | |
| dc.identifier.wos | 000175347500020 | |