| dc.contributor.author | Weiss, Zdeněk | |
| dc.contributor.author | Wyslych, Petr | |
| dc.contributor.author | Čapková, Pavla | |
| dc.contributor.author | Křístková, Monika | |
| dc.contributor.author | Havlová, Dagmar | |
| dc.date.accessioned | 2006-11-07T09:28:54Z | |
| dc.date.available | 2006-11-07T09:28:54Z | |
| dc.date.issued | 2002 | |
| dc.identifier.citation | International Conference on Engineering Education : ICEE 2001, Oslo/Bergen, Norway, August 6-10, 2001. Proceedings. 2002, p. 532-538. International journal of engineering education, vol. 18, no. 5. | en |
| dc.identifier.isbn | 1-588-74-091-9 | |
| dc.identifier.issn | 0949-149X | |
| dc.identifier.uri | http://hdl.handle.net/10084/57851 | |
| dc.language.iso | en | en |
| dc.publisher | Tempus | en |
| dc.relation.ispartofseries | International Conference on Engineering Education : ICEE 2001, Oslo/Bergen, Norway, August 6-10, 2001. Proceedings | en |
| dc.relation.uri | http://www.ineer.org/Events/ICEE2001/Proceedings/papers/479.pdf | en |
| dc.subject | atomic force microscopy | en |
| dc.subject | computer modeling | en |
| dc.subject | electron microscopy | en |
| dc.subject | Ph.D. student course | en |
| dc.subject | X-ray diffraction | en |
| dc.title | Analysis of nanostructured materials - Ph.D. course | en |
| dc.type | article | en |
| dc.identifier.location | Není ve fondu ÚK | en |
| dc.description.abstract-en | The Ph.D. student course includes four areas
oriented on analytical training in the field of nano-scale
materials. The first one is focused on the computer modeling
of nano-structured systems using the molecular simulation in
Cerius2 modeling environment, the second deals with nanoscale
surface analysis using Atomic Force Microscopy, and
the third brings advanced information about crystal
structure analysis using single-crystal and powder X-ray
diffraction methods. The last area is oriented on analysis of
materials by electron microscopy techniques. The Ph.D.
student analytical course includes both theory and
applications (training) of individual analytical procedures
for various nano-structured materials (for example,
nanotubes, intercalated and grafted clays, graphite, silicon
wafers, polymer/clay nano-composites, and metalic thin
multilayer materials). | en |
| dc.identifier.wos | 000179181200009 | |