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dc.contributor.authorVišňovský, Štefan
dc.contributor.authorPostava, Kamil
dc.contributor.authorYamaguchi, Tomuo
dc.contributor.authorLopušník, Radek
dc.date.accessioned2007-06-26T12:29:38Z
dc.date.available2007-06-26T12:29:38Z
dc.date.issued2002
dc.identifier.citationApplied Optics. 2002, vol. 41, issue 19, p. 3950-3960.en
dc.identifier.issn0003-6935
dc.identifier.issn1539-4522
dc.identifier.urihttp://hdl.handle.net/10084/60762
dc.language.isoenen
dc.publisherOptical Society of Americaen
dc.relation.ispartofseriesApplied Opticsen
dc.relation.urihttps://doi.org/10.1364/AO.41.003950en
dc.subjectoptical data storageen
dc.subjectmagneto-optic systemsen
dc.subjectoptics at surfacesen
dc.subjectthin filmsen
dc.subjectphysical opticsen
dc.subjectellipsometry and polarimetryen
dc.titleMagneto-optic ellipsometry in exchange-coupled filmsen
dc.typearticleen
dc.identifier.locationNení ve fondu ÚKen
dc.description.abstract-enAnalytical representations of Jones matrices for the magneto-optic (MO) reflection in (a) a magnetic film on a magnetic substrate separated by a nonmagnetic spacer and (b) two ultrathin magnetic films separated by a nonmagnetic spacer, sandwiched between a nonmagnetic cover and a nonmagnetic substrate with arbitrary and independent orientations of magnetization, are provided. Originally isotropic media subjected to a uniform magnetization are considered. The discussion of MO response is restricted to the terms linear in the off-diagonal permittivity tensor elements, and typical situations are illustrated numerically. The results are useful for the analysis of the experiments in MO ellipsometry and MO magnetometry of exchange-coupled magnetic ultrathin-film structures.en
dc.identifier.doi10.1364/AO.41.003950
dc.identifier.wos000176671900024


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