Show simple item record

dc.contributor.authorChlebus, Radek
dc.contributor.authorHlubina, Petr
dc.contributor.authorCiprian, Dalibor
dc.date.accessioned2007-08-29T05:51:00Z
dc.date.available2007-08-29T05:51:00Z
dc.date.issued2007
dc.identifier.citationOpto-Electronics Review. 2007, vol. 15, no. 3, p. 144-148.en
dc.identifier.issn1230-3402
dc.identifier.issn1896-3757
dc.identifier.urihttp://hdl.handle.net/10084/62294
dc.format.extent1241901 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherVersitaen
dc.relation.ispartofseriesOpto-Electronics Reviewen
dc.relation.urihttp://dx.doi.org/10.2478/s11772-007-0010-zen
dc.rights© 2007 SEP, Warsaw. This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/
dc.subjectspectral interferometryen
dc.subjectwhite-light sourceen
dc.subjectlow-resolution spectrometeren
dc.subjectMach-Zehnder interferometeren
dc.subjectgroup refractive indexen
dc.subjectdispersionen
dc.subjectquartz crystalen
dc.subjectholey fiberen
dc.titleDirect measurement of group dispersion of optical components using white-light spectral interferometryen
dc.typearticleen
dc.identifier.locationNení ve fondu ÚKen
dc.description.abstract-enWe present a simple white-light spectral interferometric technique employing a low-resolution spectrometer for a direct measurement of the group dispersion of optical components over a wide wavelength range. The technique utilizes an unbalanced Mach-Zehnder interferometer with a component under test inserted in one arm and the other arm with adjustable path length. We record a series of spectral interferograms to measure the equalization wavelength as a function of the path length difference. We measure the absolute group refractive index as a function of wavelength for a quartz crystal of known thickness and the relative one for optical fiber. In the latter case we use a microscope objective in front and a lens behind the fiber and subtract their group dispersion, which is measured by a technique of tandem interferometry including also a Michelson interferometer.en
dc.identifier.doi10.2478/s11772-007-0010-z
dc.identifier.wos000248011600003


Files in this item

This item appears in the following Collection(s)

Show simple item record

© 2007 SEP, Warsaw. This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Except where otherwise noted, this item's license is described as © 2007 SEP, Warsaw. This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.