dc.contributor.author | Chlebus, Radek | |
dc.contributor.author | Hlubina, Petr | |
dc.contributor.author | Ciprian, Dalibor | |
dc.date.accessioned | 2007-08-29T05:51:00Z | |
dc.date.available | 2007-08-29T05:51:00Z | |
dc.date.issued | 2007 | |
dc.identifier.citation | Opto-Electronics Review. 2007, vol. 15, no. 3, p. 144-148. | en |
dc.identifier.issn | 1230-3402 | |
dc.identifier.issn | 1896-3757 | |
dc.identifier.uri | http://hdl.handle.net/10084/62294 | |
dc.format.extent | 1241901 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | en |
dc.publisher | Versita | en |
dc.relation.ispartofseries | Opto-Electronics Review | en |
dc.relation.uri | http://dx.doi.org/10.2478/s11772-007-0010-z | en |
dc.rights | © 2007 SEP, Warsaw. This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License. | |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/ | |
dc.subject | spectral interferometry | en |
dc.subject | white-light source | en |
dc.subject | low-resolution spectrometer | en |
dc.subject | Mach-Zehnder interferometer | en |
dc.subject | group refractive index | en |
dc.subject | dispersion | en |
dc.subject | quartz crystal | en |
dc.subject | holey fiber | en |
dc.title | Direct measurement of group dispersion of optical components using white-light spectral interferometry | en |
dc.type | article | en |
dc.identifier.location | Není ve fondu ÚK | en |
dc.description.abstract-en | We present a simple white-light spectral interferometric technique employing a low-resolution spectrometer for a direct measurement of the group dispersion of optical components over a wide wavelength range. The technique utilizes an unbalanced Mach-Zehnder interferometer with a component under test inserted in one arm and the other arm with adjustable path length. We record a series of spectral interferograms to measure the equalization wavelength as a function of the path length difference. We measure the absolute group refractive index as a function of wavelength for a quartz crystal of known thickness and the relative one for optical fiber. In the latter case we use a microscope objective in front and a lens behind the fiber and subtract their group dispersion, which is measured by a technique of tandem interferometry including also a Michelson interferometer. | en |
dc.identifier.doi | 10.2478/s11772-007-0010-z | |
dc.identifier.wos | 000248011600003 | |