| dc.contributor.author | Postava, Kamil | |
| dc.contributor.author | Bobo, J. F. | |
| dc.contributor.author | Ortega, M. D. | |
| dc.contributor.author | Raquet, B. | |
| dc.contributor.author | Jaffres, Henri Y. | |
| dc.contributor.author | Snoeck, E. | |
| dc.contributor.author | Goiran, M. | |
| dc.contributor.author | Fert, A. R. | |
| dc.contributor.author | Redoulés, J. P. | |
| dc.contributor.author | Pištora, Jaromír | |
| dc.contributor.author | Ousset, J. C. | |
| dc.date.accessioned | 2007-09-12T07:48:07Z | |
| dc.date.available | 2007-09-12T07:48:07Z | |
| dc.date.issued | 1996 | |
| dc.identifier.citation | Journal of Magnetism and Magnetic Materials. 1996, vol. 163, issues 1-2, p. 8-20. | en |
| dc.identifier.issn | 0304-8853 | |
| dc.identifier.uri | http://hdl.handle.net/10084/62703 | |
| dc.language.iso | Neuvedeno | en |
| dc.publisher | North-Holland | en |
| dc.relation.ispartofseries | Journal of Magnetism and Magnetic Materials | en |
| dc.relation.uri | http://dx.doi.org/10.1016/S0304-8853(96)00292-2 | en |
| dc.subject | magneto-optics | en |
| dc.subject | sputtering | en |
| dc.subject | thin film | en |
| dc.subject | thin films | en |
| dc.subject | iron | en |
| dc.subject | anisotropy | en |
| dc.subject | kerr effect | en |
| dc.subject | magnetization reversal | en |
| dc.title | Magneto-optical measurements of magnetization reversal in nanometer scale sputtered Fe thin films | en |
| dc.type | article | en |
| dc.identifier.location | Není ve fondu ÚK | en |
| dc.description.abstract-en | We present a magneto-optical study of the magnetic behavior of sputtered iron films of various thickness ranging from 2 to 50 nm grown on a silicon substrate. First we calculate the reflection coefficients in the case of an homogeneous magneto-optical layer with in-plane magnetization. Then we describe a technique in which both in-plane magnetization components are detected. Because of the axial deposition procedure, iron films exhibit in-plane uniaxial anisotropy depending on the thickness of the layer. In particular, we show that, for 4 nm thickness, anisotropy induced by slightly tilted columnar growth can be observed, whereas for larger thicknesses this in-plane anisotropy vanishes. Using an accurate acquisition system based upon a rapid analog-to-digital converter we measured the rapid magnetization reversal. The field sweep rate was varied between 100 Oe/s and l MOe/s. We interpret the observed dynamical effects in terms of wall movement and microdomain reversal. | en |
| dc.identifier.doi | 10.1016/S0304-8853(96)00292-2 | |
| dc.identifier.wos | A1996VW28900003 | |