Influence of V and Mo overlayer on magneto-optical Kerr effect in ultrathin Co films

Postava, Kamil; Kurant, Zbigniew; Maziewski, Andrzej; Stupakiewicz, Andrzej; Baczewski, Lech T.; Wawro, Andrzej; Aoyama, Mitsuru; Yamaguchi, Tomuo

dc.contributor.author	Postava, Kamil
dc.contributor.author	Kurant, Zbigniew
dc.contributor.author	Maziewski, Andrzej
dc.contributor.author	Stupakiewicz, Andrzej
dc.contributor.author	Baczewski, Lech T.
dc.contributor.author	Wawro, Andrzej
dc.contributor.author	Aoyama, Mitsuru
dc.contributor.author	Yamaguchi, Tomuo
dc.date.accessioned	2007-12-17T09:53:04Z
dc.date.available	2007-12-17T09:53:04Z
dc.date.issued	2007
dc.identifier.citation	Applied Surface Science. 2007, vol. 254, issue 1, p. 360-364.	en
dc.identifier.issn	0169-4332
dc.identifier.uri	http://hdl.handle.net/10084/64488
dc.language.iso	en	en
dc.publisher	North-Holland	en
dc.relation.ispartofseries	Applied Surface Science	en
dc.relation.uri	http://dx.doi.org/10.1016/j.apsusc.2007.07.042	en
dc.subject	magneto-optic Kerr effect	en
dc.subject	V/Co and Mo/Co interfaces	en
dc.subject	ultrathin Co film	en
dc.title	Influence of V and Mo overlayer on magneto-optical Kerr effect in ultrathin Co films	en
dc.type	article	en
dc.identifier.location	Není ve fondu ÚK	en
dc.description.abstract-en	A method for characterization of sub-nanometer thick Co/V and Co/Mo interfaces is proposed that uses magneto-optical ellipsometry. Both the polar Kerr rotation and ellipticity are fitted simultaneously to different models of interface layer. The magneto-optical data are measured for varying thicknesses of the cobalt layer and overlayer by scanning of a laser beam over the samples with two orthogonal wedges. Decrease of magneto-optical effect at both interfaces Co/V and Co/Mo were observed, which corresponds to interface layers of thicknesses ranging from one to two monoatomic layers. In the case of vanadium, the interface layer is sharper and can be explained either by reduced magnetic moment of cobalt, or by anti-parallel magnetic moment of vanadium near the Co/V interface.	en
dc.identifier.doi	10.1016/j.apsusc.2007.07.042
dc.identifier.wos	000250800100081

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