Browsing by Author "Antoš, Roman"
Now showing items 1-7 of 7
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Convergence properties of critical dimension measurements by spectroscopic ellipsometry on gratings made of various materials
Antoš, Roman; Pištora, Jaromír; Mistrík, Jan; Yamaguchi, Tomuo; Yamaguchi, Shinji; Horie, Masahiro; Višňovský, Štefan; Otani, Yoshichika (Journal of Applied Physics. 2006, vol. 100, issue 5, 11 p.) -
Magneto-optical spectroscopy of Co2FeSi Heusler compound
Veis, Martin; Beran, Lukáš; Antoš, Roman; Legut, Dominik; Hamrle, Jaroslav; Pištora, Jaromír; Sterwerf, Christian; Meinert, Markus; Schmalhorst, Jan-Michael; Kuschel, Timo; Reiss, Günter (Journal of Applied Physics. 2014, vol. 115, issue 17, art. no. 17A927.) -
Modeling of reflection from textured surfaces using diffraction integrals
Kohut, Tomáš (Bakalářská práce, 2015) -
Modelování optické odezvy periodických systémů
Halagačka, Lukáš (Diplomová práce, 2010) -
Quadratic magneto-optic Kerr effect spectroscopy of Fe epitaxial films on MgO(001) substrates
Silber, Robin; Stejskal, Ondřej; Beran, Lukáš; Cejpek, Petr; Antoš, Roman; Matalla-Wagner, Tristan; Thien, Jannis; Kuschel, Olga; Wollschläger, Joachim; Veis, Martin; Kuschel, Timo; Hamrle, Jaroslav (Physical Review B. 2019, vol. 100, issue 6, art. no. 064403.) -
Spectroscopic ellipsometry on lamellar gratings
Antoš, Roman; Ohlídal, Ivan; Mistrík, Jan; Murakami, K.; Yamaguchi, Tomuo; Pištora, Jaromír; Horie, Masahiro; Višňovský, Štefan (Applied Surface Science. 2005, vol. 244, issues 1-4, p. 225-229.) -
Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate
Antoš, Roman; Pištora, Jaromír; Ohlídal, Ivan; Postava, Kamil; Mistrík, Jan; Yamaguchi, Tomuo; Višňovský, Štefan; Horie, Masahiro (Journal of Applied Physics. 2005, vol. 97, issue 5, 7 p.)