Prohlížení dle autora "Aoyama, Mitsuru"

Doping effects on optical properties of epitaxial ZnO layers determined by spectroscopic ellipsometry

Postava, Kamil; Sueki, H.; Aoyama, Mitsuru; Yamaguchi, Tomuo; Murakami, K.; Igasaki, Y. (Applied Surface Science. 2001, vols. 175-176, p. 543-548.)

Effects influencing the spectral ellipsometry angles of 2D periodical structures

Pištora, Jaromír; Vlček, Jaroslav; Yamaguchi, Tomuo; Postava, Kamil; Horie, Masahiro; Aoyama, Mitsuru (Sborník vědeckých prací Vysoké školy báňské - Technické univerzity Ostrava. Řada elektrotechnická. 2003, roč. 6, č. 1, s. 180-192 : il.)

Experimental spectral ellipsometry of 1D deep lamellar gratings

Pištora, Jaromír; Yamaguchi, Tomuo; Horie, Masahiro; Aoyama, Mitsuru (Sborník vědeckých prací Vysoké školy báňské - Technické univerzity Ostrava. Řada hornicko-geologická. 2003, roč. 49, č. 1, s. 59-67 : il.)

Influence of V and Mo overlayer on magneto-optical Kerr effect in ultrathin Co films

Postava, Kamil; Kurant, Zbigniew; Maziewski, Andrzej; Stupakiewicz, Andrzej; Baczewski, Lech T.; Wawro, Andrzej; Aoyama, Mitsuru; Yamaguchi, Tomuo (Applied Surface Science. 2007, vol. 254, issue 1, p. 360-364.)

Magnetic sensor with prism coupler

Pištora, Jaromír; Yamaguchi, Tomuo; Foldyna, Martin; Mistrík, Jan; Postava, Kamil; Aoyama, Mitsuru (Sensors and Actuators A: Physical. 2004, vol. 110, issues 1-3, p. 87-92.)

Optical characterization of TiN/SiO2(1000 nm)/Si system by spectroscopic ellipsometry and reflectometry

Postava, Kamil; Aoyama, Mitsuru; Yamaguchi, Tomuo (Applied Surface Science. 2001, vols. 175-176, p. 270-275.)

Optical measurements of silicon wafer temperature

Postava, Kamil; Aoyama, Mitsuru; Mistrík, Jan; Yamaguchi, Tomuo; Shio, K. (Applied Surface Science. 2007, vol. 254, issues 1, p. 416-419.)

Spectral ellipsometry of binary optic gratings

Pištora, Jaromír; Yamaguchi, Tomuo; Vlček, Jaroslav; Mistrík, Jan; Horie, Masahiro; Šmatko, Vasilij; Kováčová, Eva; Postava, Kamil; Aoyama, Mitsuru (Optica Applicata. 2003, vol. 33, no. 2-3, p. 251-262.)

Spectro-ellipsometric characterization and gaseous occlusion of fullerene C60 crystals

Matsumoto, Koichi; Maeda, Hiroshi; Postava, Kamil; Takahashi, K.; Aoyama, Mitsuru; Yamaguchi, Tomuo; Pištora, Jaromír (Fullerenes, Nanotubes and Carbon Nanostructures. 2003, vol. 11, issue 1, p. 15-23.)

Spectroellipsometric characterization of materials for multilayer coatings

Postava, Kamil; Aoyama, Mitsuru; Yamaguchi, Tomuo; Oda, H. (Applied Surface Science. 2001, vols. 175-176, p. 276-280.)

Spectroscopic ellipsometry of carbon nanotube formation in SiC surface decomposition

Matsumoto, Koichi; Maeda, Hiroshi; Kawaguchi, Y.; Takahashi, Katsumi; Aoyama, Mitsuru; Yamaguchi, Tomuo; Postava, Kamil (Thin Solid Films. 2004, vol. 455-456, p. 339-343.)

Spectroscopic ellipsometry of epitaxial ZnO layer on sapphire substrate

Postava, Kamil; Sueki, H.; Aoyama, Mitsuru; Yamaguchi, Tomuo; Ino, Ch.; Igasaki, Y.; Horie, Masahiro (Journal of Applied Physics. 2000, vol. 87, issue 11, p. 7820-7824.)