Browsing by Author "Mistrík, Jan"
Now showing items 1-10 of 10
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Anisotropy of magneto-optical spectra in ultrathin Fe/Au/Fe bilayers
Gřondilová, Jana; Rickart, M.; Mistrík, Jan; Postava, Kamil; Višňovský, Štefan; Lopušník, Radek; Demokritov, S.O.; Hillebrands, B. (Journal of Applied Physics. 2002, vol. 91, issue 10, p. 8246-8248.) -
Convergence properties of critical dimension measurements by spectroscopic ellipsometry on gratings made of various materials
Antoš, Roman; Pištora, Jaromír; Mistrík, Jan; Yamaguchi, Tomuo; Yamaguchi, Shinji; Horie, Masahiro; Višňovský, Štefan; Otani, Yoshichika (Journal of Applied Physics. 2006, vol. 100, issue 5, 11 p.) -
The effect of FeF2 on the magneto-optic response in FeF2/Fe/FeF2 sandwiches
Pištora, Jaromír; Lesňák, Michal; Lišková, Eva; Višňovský, Štefan; Harward, Ian R.; Maślankiewicz, Paweł; Balin, Katarzyna; Celinski, Zbigniew; Mistrík, Jan; Yamaguchi, Tomuo; Lopušník, Radek; Vlček, Jaroslav (Journal of Physics D: Applied Physics. 2010, vol. 43, no. 15, art. no. 155301.) -
Magnetic sensor with prism coupler
Pištora, Jaromír; Yamaguchi, Tomuo; Foldyna, Martin; Mistrík, Jan; Postava, Kamil; Aoyama, Mitsuru (Sensors and Actuators A: Physical. 2004, vol. 110, issues 1-3, p. 87-92.) -
Mueller matrix polarimetry of advanced structures with special optical response
Vala, Daniel (Disertační práce, 2025) -
Optical measurements of silicon wafer temperature
Postava, Kamil; Aoyama, Mitsuru; Mistrík, Jan; Yamaguchi, Tomuo; Shio, K. (Applied Surface Science. 2007, vol. 254, issues 1, p. 416-419.) -
Spectral ellipsometry of binary optic gratings
Pištora, Jaromír; Yamaguchi, Tomuo; Vlček, Jaroslav; Mistrík, Jan; Horie, Masahiro; Šmatko, Vasilij; Kováčová, Eva; Postava, Kamil; Aoyama, Mitsuru (Optica Applicata. 2003, vol. 33, no. 2-3, p. 251-262.) -
Spectroscopic ellipsometry on lamellar gratings
Antoš, Roman; Ohlídal, Ivan; Mistrík, Jan; Murakami, K.; Yamaguchi, Tomuo; Pištora, Jaromír; Horie, Masahiro; Višňovský, Štefan (Applied Surface Science. 2005, vol. 244, issues 1-4, p. 225-229.) -
Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate
Antoš, Roman; Pištora, Jaromír; Ohlídal, Ivan; Postava, Kamil; Mistrík, Jan; Yamaguchi, Tomuo; Višňovský, Štefan; Horie, Masahiro (Journal of Applied Physics. 2005, vol. 97, issue 5, 7 p.) -
Structural, optic and magnetooptic properties of epitaxial thin film ferrites
Tomíčková, Michaela (Diplomová práce, 2016)