Prohlížení dle autora "Yamaguchi, Tomuo"
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Characterization of organic low-dielectric-constant materials using optical spectroscopy
Postava, Kamil; Yamaguchi, Tomuo; Nakano, T. (Optics Express. 2001, vol. 9, issue 3, p. 141-151.) -
Convergence properties of critical dimension measurements by spectroscopic ellipsometry on gratings made of various materials
Antoš, Roman; Pištora, Jaromír; Mistrík, Jan; Yamaguchi, Tomuo; Yamaguchi, Shinji; Horie, Masahiro; Višňovský, Štefan; Otani, Yoshichika (Journal of Applied Physics. 2006, vol. 100, issue 5, 11 p.) -
Doping effects on optical properties of epitaxial ZnO layers determined by spectroscopic ellipsometry
Postava, Kamil; Sueki, H.; Aoyama, Mitsuru; Yamaguchi, Tomuo; Murakami, K.; Igasaki, Y. (Applied Surface Science. 2001, vols. 175-176, p. 543-548.) -
The effect of FeF2 on the magneto-optic response in FeF2/Fe/FeF2 sandwiches
Pištora, Jaromír; Lesňák, Michal; Lišková, Eva; Višňovský, Štefan; Harward, Ian R.; Maślankiewicz, Paweł; Balin, Katarzyna; Celinski, Zbigniew; Mistrík, Jan; Yamaguchi, Tomuo; Lopušník, Radek; Vlček, Jaroslav (Journal of Physics D: Applied Physics. 2010, vol. 43, no. 15, art. no. 155301.) -
Effects influencing the spectral ellipsometry angles of 2D periodical structures
Pištora, Jaromír; Vlček, Jaroslav; Yamaguchi, Tomuo; Postava, Kamil; Horie, Masahiro; Aoyama, Mitsuru (Sborník vědeckých prací Vysoké školy báňské - Technické univerzity Ostrava. Řada elektrotechnická. 2003, roč. 6, č. 1, s. 180-192 : il.) -
Estimation of the dielectric properties of low-k materials using optical spectroscopy
Postava, Kamil; Yamaguchi, Tomuo; Horie, Masahiro (Applied Physics Letters. 2001, vol. 79, issue 14, p. 2231-2233.) -
Experimental spectral ellipsometry of 1D deep lamellar gratings
Pištora, Jaromír; Yamaguchi, Tomuo; Horie, Masahiro; Aoyama, Mitsuru (Sborník vědeckých prací Vysoké školy báňské - Technické univerzity Ostrava. Řada hornicko-geologická. 2003, roč. 49, č. 1, s. 59-67 : il.) -
Influence of V and Mo overlayer on magneto-optical Kerr effect in ultrathin Co films
Postava, Kamil; Kurant, Zbigniew; Maziewski, Andrzej; Stupakiewicz, Andrzej; Baczewski, Lech T.; Wawro, Andrzej; Aoyama, Mitsuru; Yamaguchi, Tomuo (Applied Surface Science. 2007, vol. 254, issue 1, p. 360-364.) -
Magnetic sensor with prism coupler
Pištora, Jaromír; Yamaguchi, Tomuo; Foldyna, Martin; Mistrík, Jan; Postava, Kamil; Aoyama, Mitsuru (Sensors and Actuators A: Physical. 2004, vol. 110, issues 1-3, p. 87-92.) -
Magneto-optic ellipsometry in exchange-coupled films
Višňovský, Štefan; Postava, Kamil; Yamaguchi, Tomuo; Lopušník, Radek (Applied Optics. 2002, vol. 41, issue 19, p. 3950-3960.) -
Magneto-optic polar Kerr and Faraday effects in magnetic superlattices
Višňovský, Štefan; Postava, Kamil; Yamaguchi, Tomuo (Czechoslovak Journal of Physics. 2001, vol. 51, no. 9, p. 917-949.) -
Magneto-optic polar Kerr and Faraday effects in periodic multilayers
Višňovský, Štefan; Postava, Kamil; Yamaguchi, Tomuo (Optics Express. 2001, vol. 9, issue 3, p. 158-171.) -
Magneto-optic vector magnetometry for sensor applications
Postava, Kamil; Pištora, Jaromír; Yamaguchi, Tomuo (Sensors and Actuators A: Physical. 2004, vol. 110, issues 1-3, p. 242-246.) -
Magneto-optical ellipsometry of systems containing thick layers
Postava, Kamil; Životský, Ondřej; Pištora, Jaromír; Yamaguchi, Tomuo (Thin Solid Films. 2004, vol. 455-456, p. 615-618.) -
Magnetooptical gratings with circular dots
Vlček, Jaroslav; Pištora, Jaromír; Ciprian, Dalibor; Yamaguchi, Tomuo; Vávra, Ivo (Optica Applicata. 2003, vol.33, no. 2-3, 2003, p. 263-271.) -
Matrix description of coherent and incoherent light reflection and transmission by anisotropic multilayer structures
Postava, Kamil; Yamaguchi, Tomuo; Kantor, Roman (Applied Optics. 2002, vol. 41, issue 13, p. 2521-2531.) -
Null ellipsometer with phase modulation
Postava, Kamil; Maziewski, Andrzej; Yamaguchi, Tomuo; Ossikovski, Razvigor; Višňovský, Štefan; Pištora, Jaromír (Optics Express. 2004, vol. 12, issue 24, p. 6040-6045.) -
Optical characterization of TiN/SiO2(1000 nm)/Si system by spectroscopic ellipsometry and reflectometry
Postava, Kamil; Aoyama, Mitsuru; Yamaguchi, Tomuo (Applied Surface Science. 2001, vols. 175-176, p. 270-275.) -
Optical functions of low-k materials for interlayer dielectrics
Postava, Kamil; Yamaguchi, Tomuo (Journal of Applied Physics. 2001, vol. 89, issue 4, p. 2189-2193.) -
Optical measurements of silicon wafer temperature
Postava, Kamil; Aoyama, Mitsuru; Mistrík, Jan; Yamaguchi, Tomuo; Shio, K. (Applied Surface Science. 2007, vol. 254, issues 1, p. 416-419.)