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dc.contributor.authorLegut, Dominik
dc.contributor.authorTesch, Marc F.
dc.contributor.authorMertins, Hans-Christoph
dc.contributor.authorGilbert, Markus C.
dc.contributor.authorJansing, Christine
dc.contributor.authorBürgler, Daniel E.
dc.contributor.authorSchneider, Claus M.
dc.contributor.authorGaupp, Andreas
dc.contributor.authorHamrle, Jaroslav
dc.contributor.authorOppeneer, Peter M.
dc.date.accessioned2015-03-10T08:00:41Z
dc.date.available2015-03-10T08:00:41Z
dc.date.issued2014
dc.identifier.citationJournal of Applied Physics. 2014, vol. 115, issue 17, art. no. 17E132.cs
dc.identifier.issn0021-8979
dc.identifier.issn1089-7550
dc.identifier.urihttp://hdl.handle.net/10084/106677
dc.description.abstractWe report an investigation of the influence of the crystal structure of Co thin films on the X-ray magnetic linear dichroism (XMLD) spectrum. We compare XMLD spectra measured in reflection at the 3p-edges for two distinct orientations of the magnetization in the crystalline Co film with ab initio calculated spectra. The latter was computed for the face-centered cubic as well as the hexagonal-close packed crystal structures of Co. We find that the XMLD signal is strongly dependent on the magnetization direction with respect to the crystal axes as well as strongly influenced by the crystal structure.cs
dc.language.isoencs
dc.publisherAmerican Institute of Physicscs
dc.relation.ispartofseriesJournal of Applied Physicscs
dc.relation.urihttp://dx.doi.org/10.1063/1.4869292cs
dc.rights© 2014 AIP Publishing LLCcs
dc.titleInfluence of the crystal structure of thin Co films on X-ray magnetic linear dichroism-Comparison of ab initio theory and reflectometry experimentscs
dc.typearticlecs
dc.identifier.doi10.1063/1.4869292
dc.type.statusPeer-reviewedcs
dc.description.sourceWeb of Sciencecs
dc.description.volume115cs
dc.description.issue17cs
dc.description.firstpageart. no. 17E132cs
dc.identifier.wos000335643700505


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