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dc.contributor.authorMatěj, Zdeněk
dc.contributor.authorKadlecová, Alžběta
dc.contributor.authorJaneček, Miloš
dc.contributor.authorMatějová, Lenka
dc.contributor.authorDopita, Milan
dc.contributor.authorKužel, Radomír
dc.date.accessioned2015-05-18T09:10:08Z
dc.date.available2015-05-18T09:10:08Z
dc.date.issued2014
dc.identifier.citationPowder Diffraction. 2014, vol. 29, p. S35-S41.cs
dc.identifier.issn0885-7156
dc.identifier.issn1945-7413
dc.identifier.urihttp://hdl.handle.net/10084/106749
dc.description.abstractThe possibilities of modelling the diffraction profiles from bimodal microstructure in computer program MSTRUCT are demonstrated on two examples. A special “Double Component” profile effect can be utilized for such problems. At first it was applied to an analysis of a mixture of two nanocrystalline anatase powders with different crystallite sizes and the relative ratio of both components was determined from X-ray diffraction data. In the second case study, diffraction peaks from a pure polycrystalline copper sample treated by equal channel angular pressing were fitted using a two-phase model of large recrystallized defect-free grains and ultrafine crystallites with high dislocation density. The method is shown to be suitable for determination of the relative fraction of the microstructural components as well as other parameters (e.g. dislocation density).cs
dc.language.isoencs
dc.publisherCambridge University Presscs
dc.relation.ispartofseriesPowder Diffractioncs
dc.relation.urihttps://doi.org/10.1017/S0885715614000852cs
dc.rightsCopyright © International Centre for Diffraction Data 2014cs
dc.titleRefining bimodal microstructure of materials with MSTRUCTcs
dc.typearticlecs
dc.identifier.doi10.1017/S0885715614000852
dc.type.statusPeer-reviewedcs
dc.description.sourceWeb of Sciencecs
dc.description.volume29cs
dc.description.lastpageS41cs
dc.description.firstpageS35cs
dc.identifier.wos000353563000007


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