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dc.contributor.authorSýkora, Rudolf
dc.contributor.authorPostava, Kamil
dc.contributor.authorLegut, Dominik
dc.contributor.authorTarasenko, R.
dc.date.accessioned2016-12-08T09:19:50Z
dc.date.available2016-12-08T09:19:50Z
dc.date.issued2016
dc.identifier.citationJournal of Nanoscience and Nanotechnology. 2016, vol. 16, no. 8, p. 7818-7821.cs
dc.identifier.issn1533-4880
dc.identifier.issn1533-4899
dc.identifier.urihttp://hdl.handle.net/10084/116509
dc.description.abstractIn our previous work we presented ellipsometric measurement of (ratios of) reflection coefficients of a planar interface between air and a facet of a single-crystal monoclinic (i.e., anisotropic) material Cu(en)(H2O)(2)SO4, en = C2H8N2. The reported dependence of the coefficients on azimuthal orientation of the crystal, Figure 1 below, showed features which were ascribed to misalignment from the then-assumed ideal orientation. Here, using Berreman's formalism, we show on theoretical grounds that misalignment may truly result in the observed findings.cs
dc.language.isoencs
dc.publisherAmerican Scientific Publisherscs
dc.relation.ispartofseriesJournal of Nanoscience and Nanotechnologycs
dc.relation.urihttp://dx.doi.org/10.1166/jnn.2016.12560cs
dc.subjectreflection coefficientscs
dc.subjectbiaxial materialcs
dc.subjectBerreman's formalismcs
dc.titleCalculated reflection coefficients of a single planar interface with an optically biaxial Cu(en)(H2O)(2)SO4 material compared to experimentcs
dc.typearticlecs
dc.identifier.doi10.1166/jnn.2016.12560
dc.type.statusPeer-reviewedcs
dc.description.sourceWeb of Sciencecs
dc.description.volume16cs
dc.description.issue8cs
dc.description.lastpage7821cs
dc.description.firstpage7818cs
dc.identifier.wos000387083900010


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