Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film
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Optics express. 2006, vol. 14, issue 17, p. 7678-7685.
© 2006 Optical Society of AmericaThis paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OE.14.007678. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.