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dc.contributor.authorHlubina, Petr
dc.contributor.authorLuňáček, Jiří
dc.contributor.authorCiprian, Dalibor
dc.date.accessioned2009-07-03T11:04:12Z
dc.date.available2009-07-03T11:04:12Z
dc.date.issued2009
dc.identifier.citationOptics Letters. 2009, vol. 34, issue 10, p. 1564-1566.en
dc.identifier.issn0146-9592
dc.identifier.issn1539-4794
dc.identifier.urihttp://hdl.handle.net/10084/71336
dc.description.abstractA white-light spectral interferometric technique is used to retrieve a relative spectral phase and group delay of a multilayer mirror from the spectral interferograms recorded in a dispersive Michelson interferometer. The phase retrieval is based on the use of a windowed Fourier transform in the wavelength domain, and characterization of the multilayer mirror is completed by a three-step measurement of the reflectance spectrum of the mirror in the same interferometer.en
dc.format.extent178712 bytescs
dc.format.mimetypeapplication/pdfcs
dc.language.isoenen
dc.publisherOptical Society of Americaen
dc.relation.ispartofseriesOptics Lettersen
dc.relation.urihttp://dx.doi.org/10.1364/OL.34.001564en
dc.titleSpectral interferometry and reflectometry used for characterization of a multilayer mirroren
dc.typearticleen
dc.identifier.locationNení ve fondu ÚKen
dc.identifier.doi10.1364/OL.34.001564
dc.rights.accessopenAccess
dc.type.versionsubmittedVersion
dc.identifier.wos000267064500025


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