Maxima of the spectral reflectance ratio of polarized waves used to measure the thickness of a nonabsorbing thin film

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Title: Maxima of the spectral reflectance ratio of polarized waves used to measure the thickness of a nonabsorbing thin film
Author: Hlubina, Petr
Luňáček, Jiří
Ciprian, Dalibor
Date issue: 2010
Citation: Optics and lasers in engineering. 2010, vol. 48, issues 7-8, p. 786-791.
URI: http://hdl.handle.net/10084/78316
ISSN: 0143-8166
DOI: 10.1016/j.optlaseng.2010.03.003
URI: http://dx.doi.org/10.1016/j.optlaseng.2010.03.003
Type: Article
Document version: submittedVersion
Access rights: openAccess Fulltext Request
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