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Structure determination of thin CoFe films by anomalous x-ray diffraction

dc.contributor.authorGloskovskii, Andrei
dc.contributor.authorStryganyuk, Gregory
dc.contributor.authorOuardi, Siham
dc.contributor.authorFecher, Gerhard H.
dc.contributor.authorFelser, Claudia
dc.contributor.authorHamrle, Jaroslav
dc.contributor.authorPištora, Jaromír
dc.contributor.authorBosu, Subrojati
dc.contributor.authorSaito, Kesami
dc.contributor.authorSakuraba, Yuya
dc.contributor.authorTakanashi, Koki
dc.date.accessioned2013-01-21T11:54:36Z
dc.date.available2013-01-21T11:54:36Z
dc.date.issued2012
dc.identifier.citationJournal of Applied Physics. 2012, vol. 112, issue 7, art. no. 074903.cs
dc.identifier.issn0021-8979
dc.identifier.issn1089-7550
dc.identifier.urihttp://hdl.handle.net/10084/96058
dc.description.abstractThis work reports on the investigation of structure-property relationships in thin CoFe films grown on MgO. Because of the very similar scattering factors of Fe and Co, it is not possible to distinguish the random A2 (W-type) structure from the ordered B2 (CsCl-type) structure with commonly used x-ray sources. Synchrotron radiation based anomalous x-ray diffraction overcomes this problem. It is shown that as grown thin films and 300 K post annealed films exhibit the A2 structure with a random distribution of Co and Fe. In contrast, films annealed at 400 K adopt the ordered B2 structure.cs
dc.language.isoencs
dc.publisherAmerican Institute of Physicscs
dc.relation.ispartofseriesJournal of Applied Physicscs
dc.relation.urihttp://dx.doi.org/10.1063/1.4755801cs
dc.rights© 2013 American Institute of Physicscs
dc.subjectannealingcs
dc.subjectcobalt alloyscs
dc.subjectiron alloyscs
dc.subjectmetallic epitaxial layerscs
dc.subjectplasma materials processingcs
dc.subjectsputter depositioncs
dc.subjectsynchrotron radiationcs
dc.subjectvapour phase epitaxial growthcs
dc.subjectX-ray diffractioncs
dc.titleStructure determination of thin CoFe films by anomalous x-ray diffractioncs
dc.typearticlecs
dc.identifier.locationNení ve fondu ÚKcs
dc.identifier.doi10.1063/1.4755801
dc.relation.projectidinfo:eu-repo/grantAgreement/EC/FP7/254511cs
dc.relation.projectidinfo:eu-repo/grantAgreement/EC/FP7/254511/EU/ /HEUSPECTRO
dc.type.statusPeer-reviewedcs
dc.description.sourceWeb of Sciencecs
dc.description.volume112cs
dc.description.issue7cs
dc.description.firstpageart. no. 074903cs
dc.identifier.wos000310489400159


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