Iterrative correction of measurement with averaging of dithered samples

Abstract

Self-calibration techniques could eliminate measurement errors caused by time changes and component aging. For ADC performance enhancement also averaging is necessary. In the paper the iterative measurement error correction method is presented in combination with averaging. Dither theory for Gaussian noise has been used for exhibition of averaging abilities in ADC characteristic improvement. Experimental ENOB value improvement is more than 1.5 bit.