Domain structures and magnetization processes in thin Co films with in-plane anisotropy
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Oficyna Wydawnicza Politechniki Wrocławskiej
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Abstract
The magnetization reversal and domain structures in thin Co films in the thickness range 2 nm<d<100 nm whith in-plane magnetic anisotropy were studied. Both magneto-optical (MO) vector magnetometry and MO microscopy were used. The crossover of in-plane anisotropy symmetry from two-fold to six-fold were observed with increase of Co layer thickness from 2 nm to 100 nm. The evolution of the domain structure during the magnetization reversal process was studied for different orientations of magnetic field relatively to anisotropy easy axis using longitudinal Kerr MO microscope.
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magnetization reversal, domain structure, Kerr effect, magneto-optic vector magnetometry
Citation
Materials Science-Poland. 2006, vol. 24, no. 3, p. 639-642.